Examination - On Demand (E-OD) : An Innovation In Exam System
| dc.contributor.author | Xavier, Giju | |
| dc.coverage.placeName | India | en_US |
| dc.coverage.spatial | Asia | en_US |
| dc.date.accessioned | 2019-04-24T20:52:17Z | |
| dc.date.available | 2019-04-24T20:52:17Z | |
| dc.date.issued | 2008 | |
| dc.description.abstract | When i start the day with morning news paper, it’s very sad to learn that-“Exam System drives Kids to Suicide - 6000 died of exam in 2007 in India” which means 16 youths a day. Unbelievable to me and to the world. The examination system today in India follows an orthodox pattern of evaluating the student annually, putting high burden of course and in the prefixed time frame. Examinations should not be seen as a trouble but as a tool for enhancing learning. Examination system needs to be flexible, adaptable and transparent in view of paradigm shift in teaching and learning processes. Open learning/Distance Education is the methodology in which the learner does not go to Educational Institution but the Education comes to his doorstep. Even with the conventional system of learning the evaluation pattern needs to be changed with Examination - On Demand (E-OD) - the only answer. The evaluation system is ready to take the exam when the learner is willing to appear for the Exam. To achieve this objective the technological advancement the world over is tapped by the individual/institution as the success of this system very much depends upon the optimum utilization of the technology in the field of education and communication. ICT can be used as a major strategy towards reaching the unreached even. // Paper ID 311 | en_US |
| dc.identifier.uri | http://hdl.handle.net/11599/3153 | |
| dc.language.iso | en | en_US |
| dc.publisher | Commonwealth of Learning (COL) | en_US |
| dc.rights.uri | https://creativecommons.org/licenses/by-sa/4.0/ | en_US |
| dc.subject | Open and Distance Learning (ODL) | en_US |
| dc.subject | Innovation | en_US |
| dc.title | Examination - On Demand (E-OD) : An Innovation In Exam System | en_US |
| dc.type | Working Paper | en_US |